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首页> 外文期刊>Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films >Thin films of Zn-Tetrakis(4-Hydroxyphenyl) Porphyrin: Formation, morphology and electrochemical properties
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Thin films of Zn-Tetrakis(4-Hydroxyphenyl) Porphyrin: Formation, morphology and electrochemical properties

机译:Thin films of Zn-Tetrakis(4-Hydroxyphenyl) Porphyrin: Formation, morphology and electrochemical properties

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摘要

? 2022This work presents the results of obtaining polyporphyrin Zn-tetrakis(4-hydroxyphenyl)porphyrin films by superoxide-assisted electrochemical deposition. The study determines the regions of potentials where the polyporphyrin film on the working electrode is formed. It also proposes mechanisms of formation of radical porphyrin species in these regions. The data obtained by electrochemical impedance spectroscopy show an increase in the charge transfer resistance and a decrease in the electrical double layer capacitance at the solid/liquid interface during the film formation. The resistance of the film formed was also determined in situ. The paper presents the results of determining the main type of porphyrin binding in the polymer by Raman spectroscopy and suggests variants of recombination of the resulting radical porphyrin forms. The atomic force microscopy is applied to obtain data on the microrelief and thickness of the films prepared. The calculation of specific conductivity gives the value about 1.2 × 10?4 S?m that is typical of semiconductors. The spectroelectrochemical method was used to show the RedOx processes of the porphyrin moieties in the obtained films at low potentials.

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