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机译:Three-dimensional particle tracking in concave structures made by ultraviolet nanoimprint via total internal reflection fluorescence microscopy and refractive-index-matching method
Tokyo Univ Sci, Dept Appl Elect, Katsushika Ku, 6-3-1 Niijuku, Tokyo 1258585, Japan;
Tokyo Univ Sci, Dept Mech Engn, 1-1-1 Daigakudo Ri, Yamaguchi 7560884, Japan;
Evanescent light; Particle tracking velocimetry; Micro-pattern;