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A Model of the Temperature Dependence of Concentration Quenching of Luminescence in Doped Insulators

机译:掺杂绝缘子发光浓度猝灭的温度依赖性模型

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摘要

We have developed a model for the temperature dependence of the concentration quenching of luminescent materials, and have applied this model to YAG:Ce. This model of concentration quenching is based on an assumption in which, following excitation of an activator ion, there is energy migration via non-radiative energy transfer among similar ions, finally ending at a "killer" site. The temperature dependence of a single ion-ion energy transfer process is assumed to be determined solely by the overlap of the emission and absorption bands of the donor and acceptor ions. Using our previous results to calculate the temperature dependence of this overlap function, we propose a model for calculating the effect of concentration quenching on the lifetime of the luminescent ion. This model has two parameters, one of which is the average number of energy transfer jumps that occur before reaching a killer site. In the case of YAG:Ce, we show that the observed temperature dependence of the Ce lifetime at various concentrations can be explained satisfactorily using this model.
机译:我们建立了一个发光材料浓度猝灭的温度依赖性模型,并将该模型应用于YAG:Ce。这种浓度猝灭模型基于一个假设,即在激活离子激发后,通过类似离子之间的非辐射能量转移进行能量迁移,最终在“杀手”位点结束。假设单个离子-离子能量转移过程的温度依赖性仅由供体离子和受体离子的发射带和吸收带的重叠决定。利用我们之前的结果来计算该重叠函数的温度依赖性,我们提出了一个模型来计算浓度猝灭对发光离子寿命的影响。该模型有两个参数,其中一个是到达杀手点之前发生的能量转移跳跃的平均次数。在YAG:Ce的情况下,我们表明,使用该模型可以令人满意地解释观察到的不同浓度下Ce寿命的温度依赖性。

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