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首页> 外文期刊>IEEE journal of selected topics in quantum electronics: A publication of the IEEE Lasers and Electro-optics Society >3D Integrated Laser Attach Technology on a 300-mm Monolithic CMOS Silicon Photonics Platform
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3D Integrated Laser Attach Technology on a 300-mm Monolithic CMOS Silicon Photonics Platform

机译:300mm 单片 CMOS 硅光子学平台上的 3D 集成激光贴装技术

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Enabling cost-effective and power-efficient laser source on a silicon photonics (SiPh) platform is a major goal that has been highly sought after. In the past two decades, tremendous effort has been made to develop various on-chip integration techniques to enhance SiPh circuits with efficient light-emitting materials. Here we review our recent advancements in hybrid flip-chip integration of III-V lasers on a 300-mm monolithic SiPh platform. By leveraging advanced complementary metal oxide semiconductor (CMOS) manufacturing processes, we have demonstrated wafer-scale laser attach based on a precisely controlled cavity formed on a silicon-on-insulator (SOI) substrate. The laser integration process is aided by precise mechanical alignment features on the SiPh wafer and high-precision fiducials on the laser. Efficient laser-to-SiPh-circuit butt-coupling with optical power up to 20 mW was demonstrated through wafer- and module-level characterizations. Key performance metrics including side-mode suppression ratio, mode-hopping, and relative intensity noise were characterized after laser integration. In addition, early reliability assessments were performed on laser-attached SOI wafers and Si submount assemblies to understand the long-term performance stability of the lasers on the monolithic platform. To further enhance the performance of the laser-integrated chip, we explored alternative spot-size converters that could simultaneously enable improved coupling efficiency and relaxed fabrication tolerance, thus showing great promise over traditional designs.
机译:在硅光子学 (SiPh) 平台上实现经济高效且高能效的激光源是备受追捧的主要目标。在过去的二十年中,人们付出了巨大的努力来开发各种片上集成技术,以使用高效的发光材料来增强 SiPh 电路。在这里,我们回顾了我们在 300 mm 单片 SiPh 平台上混合 III-V 激光器混合倒装芯片集成的最新进展。通过利用先进的互补金属氧化物半导体 (CMOS) 制造工艺,我们展示了基于在绝缘体上硅 (SOI) 衬底上形成的精确控制腔的晶圆级激光贴装。SiPh 晶圆上的精确机械对准特征和激光器上的高精度基准点有助于激光集成过程。通过晶圆级和模块级表征,展示了光功率高达 20 mW 的高效激光到 SiPh 电路对接耦合。对激光器积分后的关键性能指标进行了表征,包括边模抑制比、跳模和相对强度噪声。此外,还对激光连接的SOI晶圆和硅基板组件进行了早期可靠性评估,以了解激光器在单片平台上的长期性能稳定性。为了进一步提高激光集成芯片的性能,我们探索了替代的光斑尺寸转换器,这些转换器可以同时提高耦合效率和放宽制造公差,从而显示出优于传统设计的巨大前景。
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