机译:通过 IEC60891:2021 程序 3 分析非晶硅基组件暴露 11 年后的降解
Università degli Studi di Salerno;
Solar PV Consultancy Services, Solkeys;
Universidad de Málaga;
amorphous silicon; IEC60891; I‐V curve correction; microcrystalline silicon; outdoor measurement; photovoltaic degradation; thin film;