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首页> 外文期刊>Nanotechnology >Heterostructure axial GaAsSb ensemble near-infrared p-i-n based axial configured nanowire photodetectors
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Heterostructure axial GaAsSb ensemble near-infrared p-i-n based axial configured nanowire photodetectors

机译:基于异质结构轴向GaAsSb集合近红外p-i-n的轴向构型纳米线光电探测器

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In this work, we present a systematic design of growth experiments and subsequent characterization of self-catalyzed molecular beam epitaxially grown GaAsSb heterostructure axial p-i-n nanowires (NWs) on p-Si for the ensemble photodetector (PD) application in the near-infrared region. Diverse growth methods have been explored to gain a better insight into mitigating several growth challenges by systematically studying their impact on the NW electrical and optical properties to realize a high-quality p-i-n heterostructure. The successful growth approaches are Te-dopant compensation to suppress the p-type nature of intrinsic GaAsSb segment, growth interruption for strain relaxation at the interface, decreased substrate temperature to enhance supersaturation and minimize the reservoir effect, higher bandgap compositions of the n-segment of the heterostructure relative to the intrinsic region for boosting the absorption, and the high-temperature ultra-high vacuum in situ annealing to reduce the parasitic radial overgrowth. The efficacy of these methods is supported by enhanced photoluminescence (PL) emission, suppressed dark current in the heterostructure p-i-n NWs accompanied by increased rectification ratio, photosensitivity, and a reduced low-frequency noise level. The PD fabricated utilizing the optimized GaAsSb axial p-i-n NWs exhibited the longer wavelength cutoff at similar to 1.1 mu m with a significantly higher responsivity of similar to 120 A W-1 (@-3 V bias) and a detectivity of 1.1 x 10(13) Jones operating at room temperature. Frequency and the bias independent capacitance in the pico-Farad (pF) range and substantially lower noise level at the reverse biased condition, show the prospects of p-i-n GaAsSb NWs PD for high-speed optoelectronic applications.
机译:在这项工作中,我们提出了自催化分子束外延生长的GaAsSb异质结构轴向p-i-n纳米线(NWs)在p-Si上的生长实验的系统设计以及后续表征,用于近红外区域的集成光电探测器(PD)应用。通过系统地研究它们对NW电学和光学特性的影响,探索了多种生长方法,以实现高质量的p-i-n异质结构,从而更好地了解缓解多种生长挑战。成功的生长方法是Te-掺杂剂补偿抑制GaAsSb本征段的p型性质,生长中断以在界面处进行应变弛豫,降低衬底温度以增强过饱和度并最小化储层效应,异质结构n段相对于本征区域的带隙组成更高以促进吸收,以及高温超高真空原位退火以减少寄生径向退火过度。增强的光致发光 (PL) 发射、抑制异质结构 p-i-n NW 中的暗电流以及增加的整流比、光敏性和降低的低频噪声水平支持了这些方法的功效。利用优化的GaAsSb轴向p-i-n NWs制备的PD表现出更长的波长截止值,接近1。1 μ m,响应度明显更高,类似于 120 A W-1 (@-3 V bias),检测率为 1.1 x 10(13) Jones,在室温下工作。频率和偏置独立于皮法拉(pF)范围的电容以及反向偏置条件下显著降低的噪声水平,显示了p-i-n GaAsSb NWs PD在高速光电应用中的前景。

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