Identifying single electron charge sensor events using wavelet edge detection (vol 26, 215201, 2015)

摘要

The simulated noise used to benchmark wavelet edge detection in this work was described incorrectly. The correct description is given here, and new results based on noise that matches the original description are provided. The results support our original conclusion, which is that wavelet edge detection outperforms thresholding in the presence of white noise and 1/f noise.