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首页> 外文期刊>Journal of instrumentation: an IOP and SISSA journal >Prototype characterization of a charge-integration pixel detector readout chip with in-pixel A/D conversion
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Prototype characterization of a charge-integration pixel detector readout chip with in-pixel A/D conversion

机译:Prototype characterization of a charge-integration pixel detector readout chip with in-pixel A/D conversion

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摘要

HYLITE (High dYmamic range free electron Laser Imaging deTEctor) is a hybrid pixel detector readout chip, which is designed for advanced light sources such as X-ray Free Electron Laser (XFEL) and diffraction-limited storage rings. It is a charge-integration readout chip which has three gains for different dynamic ranges and automatic gain-switching function. The full dynamic range covered by HYLITE is 1~10~4 photons with an energy of 12 keV for each pixel in every shot. In-pixel ADC is designed to achieve front-end digitization and a 10 kHz continuous frame rate. HYLITE0.1 is the first prototype chip for functional verification that was produced in CMOS 0.13 μm technology. It consists of a pixel array with 6 × 12 pixels and a periphery with full standalone operation features. The size of each pixel is 200 μm× 200 μm. Three design variations of pixels with different integrating capacitance and structures were designed to optimize between area and performance. A 10-bit Wilkinson ADC is integrated in each pixel to digitize the outputs of the pre-amplifier. Therefore, analog signal transmission of long distance is avoided and a frame rate of 10 kHz can be achieved. In this paper, we present the design of HYLITE0.1 and the test results of this prototype chip.

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