Size- and temperature-control optical direct/indirect band tuning in layered compounds: band gap engineering

摘要

The X-ray diffraction (XRD) is studied in thermally evaporated cadmium iodide (CdI2) thin films with various thicknesses (0.4-5.5 mu m) and grain sizes (100-160 nm). The grain size, calculated from the XRD, is found to increase with increasing the thickness of the film, while the reflectivity and refractive index decease with increasing the wavelength of the exciting light. The optical absorption spectra show both allowed direct and indirect interband transitions across a fundamental gap in CdI2. It is found that both indirect and direct band gap (E-g) decrease with increasing the thickness of the film and that the indirect E-g is lower than the direct E-g by an amount of about 0.7 eV. The direct E-g is also decreased with increasing both the grain size and temperature. However, the temperature dependence of E-g follows the Varshni relation. Our results highlight the possibility of engineering or tuning the E-g of CdI2 by controlling the thickness of the film, grain size as well as temperature.