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机译:A Systematic Material Characterization Method via Near-Field Scanning Microwave Microscopy
National University of Singapore;
Beihang University;
Zhejiang UniversityBeijing Institute of Technology;
Coaxial resonator (CR); dielectric characterization; Huygens’ principle; near-field scanning microwave microscopy (NFSMM); nonlinear inversion; Computational modeling; Dielectrics; Admittance; Capacitance; Microwave theory and techniques; Transmission line measurements; Shape;