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Ultrathin, Electrically Small Noise Suppression Sheet for Microwave Cavities of 3-D Integrated Circuits: Design Methodology and Realization

机译:用于3D集成电路微波腔的超薄电小型噪声抑制片:设计方法和实现

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摘要

Miniaturized microwave cavities constructed by the parallel-plate waveguide (PPW) becomes one of the main propagation pathways of the radio-frequency interference (RFI) in 3-D integrated circuits. It is still challenging to suppress RFI in the practical cavities, where the space is extremely constrained. In this work, the working mechanism and design method of the noise suppression sheet (NSS) is quantitatively studied, serving as an efficient approach to suppress RFI within an electrically small size in these microwave cavities. The analysis is based on the dispersion relationship derivation of the NSS-loaded PPW structure. Both the derived formulas and the numerical study reveal that the imaginary part of the permeability, that is, mu(i), of the NSS plays a key role in increasing the reflection and attenuation loss, and thus obtaining a high RFI suppression level. Further study indicates even when the NSS's profile is lower than 10 of the cavity's height and the length is lower than 0.1 lambda(0), its suppression level up to 10 dB can be well accomplished, which is deemed difficult to achieve by using conventional methods. Moreover, this method is, respectively, applied in three practical engineering scenarios for the RFI suppression, that is, heatsink package above a chip, power distributed network (PDN), and flexible circuit. Good agreement is observed between the measurement results and the simulated ones, which confirmed the efficacy of our quantitatively developed NSS. The proposed method is promising for broad industrial applications, such as tiny chip packages, multi-channel systems, and flexible electronics.
机译:平行板波导(PPW)构建的小型化微波腔成为射频干扰(RFI)在三维集成电路中的主要传播途径之一。在空间极度受限的实际腔体中抑制RFI仍然具有挑战性。本文定量研究了噪声抑制片(NSS)的工作机理和设计方法,为这些微波腔中小尺寸的RFI抑制提供了一种有效的方法。该分析基于NSS负载PPW结构的色散关系推导。推导的公式和数值研究表明,NSS磁导率的虚部μ(i)在增加反射和衰减损耗方面起着关键作用,从而获得了较高的RFI抑制水平。进一步的研究表明,即使NSS的轮廓低于腔体高度的10%,长度小于0.1 lambda(0),其高达10 dB的抑制水平也可以很好地实现,这是传统方法难以实现的。此外,该方法还分别应用于芯片上方散热片封装、分布式网络(PDN)和柔性电路三种RFI抑制的实际工程场景中。测量结果与模拟结果吻合良好,证实了定量开发的NSS的有效性。所提出的方法有望用于广泛的工业应用,例如微型芯片封装、多通道系统和柔性电子器件。

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