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Investigation of low frequency noise-current correlation for the InAs/GaSb type-II superlattice long-wavelength infrared detector

机译:InAs/GaSb II型超晶格长波长红外探测器低频噪声-电流相关性研究

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摘要

In this paper, a mesa-type 256 x 8 long-wavelength infrared detector is prepared by using InAs/GaSb type-II superlattice (T2SL) material with double barrier structure. The area of each pixel is 25 x 25 mu m(2). The cut-off wavelength and dark current density of the detector at -0.05 V bias with liquid nitrogen temperature are 11.5 mu m and 4.1 x 10(-4) A/cm(2), respectively. The power spectral densities of low-frequency noise under different temperatures have also been fitted through the Hooge model, and the correlations with dark current are extracted subsequently. The results shown that the 1/f noise of the detector is mainly caused by the generation-recombination current at a low reverse bias, however, when the reverse bias is high, the 1/f noise should be expressed by the sum of I-gr noise and I-btb noise which was ignored in the previous research. The 1/f noise-current correlation assessed in this work can provide insight into the low frequency noise characteristics of InAs/GaSb T2SL long-wavelength detectors, and allow us to understand the main source of low-frequency noise better.
机译:本文采用具有双势垒结构的InAs/GaSb II型超晶格(T2SL)材料制备了台面型256×8长波红外探测器。每个像素的面积为 25 x 25 μ m(2)。在-0.05 V偏置和液氮温度下,探测器的截止波长和暗电流密度分别为11.5 μ m和4.1 x 10(-4) A/cm(2)。通过Hooge模型拟合了不同温度下低频噪声的功率谱密度,并提取了与暗电流的相关性。结果表明,探测器的1/f噪声主要由低反向偏置下的生成-复合电流引起,而当反向偏置较高时,1/f噪声应由I-gr噪声和I-btb噪声之和表示,这在前人的研究中被忽略了。本文评估的1/f噪声-电流相关性有助于深入了解InAs/GaSb T2SL长波长探测器的低频噪声特性,并有助于更好地理解低频噪声的主要来源。

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