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Cluster ion beam processing

机译:Cluster ion beam processing

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摘要

Recent requirements of materials processing by ion beams are now beyond their fundamental limits. Technologies which are much more controllable and versatile on an atomistic scale are needed. Gas cluster ion beam processing which has been developed at Kyoto University is one of the candidates to overcome the present limits. This paper discusses recent requirements in ion beam processing. Possible solutions by cluster ion beam processing are discussed in the following areas: (1) shallow junction formation; (2) high rate etching and atomically smooth surface formation; and (3) high quality thin film deposition. The gas cluster ion beam processing is discussed in comparison with traditional ion beam processing which is presently limited by available atomic and molecular ion beams. (C) 1998 Elsevier Science Ltd. All rights reserved. [References: 30]

著录项

  • 来源
    《Solid-State Electronics》 |1998年第5期|A27-0|共1页
  • 作者

    Yamada I.; Matsuo J.;

  • 作者单位

    Kyoto Univ, Ion Beam Engn Expt Lab, Sakyo Ku, Kyoto 60601, Japan, .;

    harmacy.purdue.edu;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类 一般性问题;
  • 关键词

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