Improvements in conversion efficiency and power density are expected from reducing the power loss of new semiconductor power devices, such as SiC and GaN devices. However, the volume and power loss of passive components has relatively increased, and hence, reducing the power loss of inductors is significantly important. In this paper, the authors propose a simple method for calculating the loss caused by fringing flux near the air gap at the core of a filter inductor. The calculated results are compared with experimental results, and the effectiveness of the proposed method is verified.
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