Changes in the Electrical Conduction of Glass, Quartz, and Au, C, and MoS 2 Films under Continuous Proton Injection

摘要

A change in the electrical conduction of a wide range of materials with different crystallochemical types and electrophysical properties (quartz, glass, molybdenum disulfide, graphite, and gold) exposed to continuous proton injection is studied. Film samples of layered MoS_(2)compounds and graphite are obtained on rough surfaces of glass and quartz by mechanical rubbing in of powder. Gold films are made on glass substrates by magnetron sputtering of a gold target. To generate a continuous proton flux for injection into the studied sample, a steady-state ion source with a cold cathode and a magnetic field producing an ion beam with relatively low intensity was used. The current strength of the ion beam was up to 1.2 mA, the hydrogen pressure in the chamber was ~10~(–2)Pa, and the energy of hydrogen ions was from 1 to 4 keV. It is shown that, under continuous proton injection, the electrical conduction of thin films with a layered structure (MoS_(2)and graphite) has a sharp rise of 4 to 5 orders of magnitude. This effect is strengthened when the temperature is decreased from ~293 to ~77 K as well as when the number of charges delivered to the sample is increased. In the case of continuous proton injection into bulk insulators (glass, quartz) and gold thin films, no noticeable changes in the electrical conduction are revealed.