Measurements of the Complex Anisotropic Permittivity of Laminates With TM0n0 Cavity

摘要

Low-loss dielectric laminates that are routinely used in the manufacturing of printed circuit boards (PCBs) are known to be anisotropic. The in-plane and the out-of-plane components of the dielectric permittivity have been so far typically determined using one of several available methods. In this article, we performed measurements of both components of complex permittivity of selected isotropic and anisotropic laminar materials employing a combination of a few split-post dielectric resonators (SPDRs) and one cylindrical cavity supporting several TM0n0 modes in the microwave band. Based on obtained data a novel, more precise approach to measuring the out-of-plane component of complex permittivity of laminar samples has been proposed. Additionally, a detailed analysis of several sources of measurement uncertainty (e.g., due to finite tolerances of manufacturing of the sample) has been performed and some recommendations formulated.