Optoelectronic properties and defect analysis for PVA/Cu nanocomposites films

摘要

The characterization of polymeric nanocomposite thin films of polyvinyl alcohol (PVA) doped with various concentrations of copper nanoparticles (Cu-NPs) by the aid of casting technique is synthesis and detailed. The PVA/Cu nanocomposite thin films are containing wt.% = 0%, 0.04%, 0.08%, and 0.1% of (Cu-NPs). The X-ray diffraction (XRD) exhibits the semi-crystalline behavior of all polymeric films. The Fourier transform Infrared (FTIR) results show some remarkable changes in the spectral characteristics of the thin films after adding (Cu-NPs) to (PVA) solution. Scanning electron microscopy (SEM) shows partial homogeneity between the polymeric matrix and the nano filler. The Ultraviolet-Visible (UV-Vis) spectroscopy is used to measure the optical parameters. Tauc and Urbach models are used to predict optical bandgap energy (E-g), Urbach energy (E-u), and optoelectronic properties of PVA/ Cu-NPs nanocomposites. The dielectric characteristics of the nanocomposite thin films show an improvement when the nano-filler is added to the polymeric matrix. The changes in microstructure of the PVA/Cu-NPs composite thin films are analyzed by the positron annihilation lifetime (PAL) and the Doppler broadening (DB) techniques.