Absorption correction and normalization of X‐ray small‐angle scattering data for materials producing intense scattering at extremely low angles

摘要

Some materials of low absorption that contain particles in the several thousand Å range can produce an intensity of small‐angle scattering that is a significant fraction of that of the transmitted beam. This is quite apparent in the range of a few s scattering angle when a Bonse–Hart small‐angle scattering diffractometer is used. A method was developed that allows an accurate absorption correction to be calculated when the scattering by the sample can be approximated by an exponential function in the range of 0 to 5 s double Bragg angle 2θ. Variation of sample thickness allows the correction method to b