Residual stresses are one of the important feature determining the performance of structural as well as functional materials. Since residual stresses are difficult to be predicted they must be reliably measured. X-Ray microdiffraction laboratory systems equipped with 2D detectors allow to evaluate them with a very high spatial resolution. In this work a new method to evaluate residual stresses based on the analysis of a single Debye ring is proposed. This method is particularly suitable for the stress analysis of coatings and for sample with complex geometry. Examples are discussed and the results compared with those obtained by the conventional d-sin~2 psi method.
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机译:残余应力是决定结构材料和功能材料性能的重要特征之一。由于残余应力难以预测,因此必须可靠地测量残余应力。配备 2D 探测器的 X 射线微衍射实验室系统允许以非常高的空间分辨率对其进行评估。本文提出了一种基于单德拜环分析的残余应力评估方法。该方法特别适用于涂层的应力分析和具有复杂几何形状的样品。讨论了实例,并将结果与传统的d-sin~2 psi方法的结果进行了比较。
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