Polycrystalline 8 mol percent Y_2O_3-stabilized ZrO_2 films with thicknesses of 12 and 25 mil were deposited on (100) MgO substrates, their nanostructures were investigated by means of transmission electron microscopy (TEM). high-resolution TEM and atomic force microscopy, and the electrical properties of the nanostructured films were characterized in dry and humid O_2. Compared with micro-crystalline bulk ceramics, the ionic conductivity of the nanostructured films is lower by about a factor of 4, which is mainly due to the lower bulk conductivity and the low grain-boundary conductivity. There is not remarkable proton conduction in the nanostructured films when annealed in water vapor, and the influence of the ZrCb/MgO interface on its ionic conduction is negligible.
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