An investigation of the structural properties of a novel metal-semiconductor alloy based on CdTe and Cu is presented. The samples were prepared as thin films by radio frequency sputtering. On the basis of chemical analyses carried out by Augerspectroscopy and energy depersive X-ray analysis, it was concluded that a new semiconducting alloy has been created: Cu{sub}xCd{sub}(1-x)Te. X-ray diffraction and Raman scattering experiments showed that the incorporation of Cu into the CdTe lattice didnot produce significant structural changes The best crystalline properties were found for samples when x≤ 0.02. The Raman scattering spectra showed up to the third-order longitudinal optic node, which is indicative of high-quality crystalline properties. The alloy band gap was slightly reduced with respect to pure CdTe being, at most. 50 meV lower.
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