Correlation between EMI‐induced failures and large‐signal response of fet‐input opamps

摘要

AbstractCorrelation between EMI susceptibility of opamp circuits and asymmetry in the slew‐rates of the basic opamp is discussed with reference to FET‐input devices. For the LF355 opamp the role played by an internal feedback loop on the common‐mode, slew‐rate and susceptibility performances is analysed. Other FET‐input opamps, such as the OP42, which exhibit an almost symmetric slew‐rate, have a very small EMI sus