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Wide Range CMOS Voltage Detector with Low Current Consumption and Low Temperature Variation

机译:宽范围CMOS电压检测器,具有低电流消耗和低温度变化

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摘要

A wide range CMOS voltage detector with low current consumption consisting of CMOS inverters operating in both weak inversion and saturation region is proposed. A terminal of power supply for CMOS inverter can be expanded to a signal input terminal. A voltage-detection point and hysteresis characteristics of the proposed circuit can be designed by geometrical factor in MOSFET and an external bias voltage. The core circuit elements are fabricated in standard 0.18μm CMOS process and measured to confirm the operation. The detectable voltage is from 0.3 V to 1.8 V. The current consumption of voltage detection, standby current, is changed from 65 pA for V_(in) = 0.3 V to 5.5μA for V_(in) = 1.8 V. The thermal characteristics from 250 K to 400 K are also considered. The measured temperature coefficient of the proposed voltage-detector core operating in weak inversion region is 4ppm/K and that in saturation region is 10ppm/K. The proposed voltage detector can be implemented with tiny chip area and is expected to an on-chip voltage detector of power supply for mobile application systems.
机译:该文提出一种低电流消耗的宽范围CMOS电压检测器,该检测器由工作在弱反转和饱和区域的CMOS逆变器组成。CMOS变频器的电源端子可以扩展为信号输入端子。所提电路的电压检测点和迟滞特性可以通过MOSFET中的几何系数和外部偏置电压来设计。核心电路元件采用标准的0.18μm CMOS工艺制造,并进行测量以确认操作。可检测电压范围为0.3 V至1.8 V。电压检测的消耗(待机电流)从V_(in) = 0.3 V时的65 pA更改为V_(in) = 1.8 V时的5.5μA。还考虑了 250 K 至 400 K 的热特性。所提电压检测器磁芯在弱反转区测得的温度系数为4ppm/K,在饱和区测得的温度系数为10ppm/K。所提出的电压检测器可以用极小的芯片面积实现,并有望成为用于移动应用系统电源的片上电压检测器。

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