机译:Spectroscopic ellipsometry from 10 to 700 K
New Mexico State Univ;
cryostat; dielectric function; electron-phonon interaction; spectroscopic ellipsometry; temperature; windows; COMPLEX DIELECTRIC FUNCTION; FAR-INFRARED ELLIPSOMETRY; CRITICAL-POINT PARAMETERS; III-V SEMICONDUCTORS; TEMPERATURE-DEPENDENCE; OPTICAL-PROPERTIES; REFRACTIVE-INDEX; FERMI-SURFACE; BAND-GAP; NICKEL;