机译:All-Digital On-Chip Monitor for PMOS and NMOS Process Variability Utilizing Buffer Ring with Pulse Counter
VLSI Design and Education Center (VDEC), The University of Tokyo, Tokyo, 113-0032 Japan;
Department of Electrical Engineering and Information Systems, The University of Tokyo, Tokyo, 113-8656 Japan;
process variability; all digital; on-chip monitor; buffer ring; nbti; pbti;