Study of the anisotropy parameters of multilayer polymeric films and identification of their surface roughness by means of determinate Mueller matrices

摘要

The Mueller method is used to study the orientational order in multilayer polymeric films and their surface roughness. The films and their surfaces are modelled by an equivalent optical system consisting of sequential elements with linear and circular amplitude and phase anisotropy. The question of using Mueller-Jones matrices to find the parameters of polymeric films during their production is discussed.