机译:Optimal sample preparation for nanoparticle metrology (statistical size measurements) using atomic force microscopy
Department of Chemical Engineering and Materials Science, University of California, Irvine, 916 Engineering Tower, Irvine, CA 92697-2575, USA;
Technology Center, Pacific Nanotechnology, Inc., 18468 Ward St., Fountain Valley, CA 92708, USA;
Atomic force microscope; Instrumentation; Nanoparticles; Nanoscale metrology; Size characterization;