机译:Combinatorial Test Generation for Multiple Input Models With Shared Parameters
Department of Computer Science and Engineering, University of Texas at Arlington, Arlington, TX, USA;
School of Information Science and Technology, Southwest Jiaotong University, Chengdu, Sichuan, China;
Information and Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USAResearch and Development, Dassault Systems, New York, NY, USA;
Testing; Test pattern generators; Redundancy; Tools; Schedules; Presses; Information science;