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首页> 外文期刊>Journal of near infrared spectroscopy >Before reliable near infrared spectroscopic analysis-the critical sampling proviso. Part 2: Particular requirements for near infrared spectroscopy
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Before reliable near infrared spectroscopic analysis-the critical sampling proviso. Part 2: Particular requirements for near infrared spectroscopy

机译:在可靠的近红外光谱分析之前 - 关键的采样条件。第 2 部分:近红外光谱的特殊要求

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Non-representative sampling of materials, lots and processes intended for NIR analysis is often fraught with hidden contributions to the full Measurement Uncertainty MUtotal = TSE + TAE(NIR). The Total Sampling Error (TSE) can dominate over the Total Analytical Error TAE(NIR) by factors 5-10-25, depending on the degree of material heterogeneity and the specific sampling procedures employed to produce the minuscule aliquot, which is the only material actually analysed. Part 1 presented a brief of all sampling uncertainty elements in the "lot-to-aliquot" pathway, which must be identified and correctly managed (eliminated or reduced maximally), especially the sampling bias, as a prerequisite to achieve fully representative sampling. The key for this is the Theory of Sampling (TOS), which is presented in two parts in a novel compact fashion. Part 2 introduces (i) application of TOS to process sampling, specifically addressing and illustrating how this manifests itself in the realm of PAT, Process Analytical Technology, and (ii) an empirical safeguard facility, termed the Replication Experiment (RE), with which to estimate the effective sampling-plus-analysis uncertainty level (MUtotal) associated with NIR analysis. The RE is a defence against compromising the analytical responsibilities. Ignorance, either caused by lack of awareness or training, or by wilful neglect, of the demand for TSE minimisation, is a breach of due diligence concerning analysis QC/QA. Part 2 ends with a special focus on: "What does all this TOS mean specifically for NIR analysis?". The answer to this question will perhaps surprise many. There is nothing special that need worrying NIR analysts relative to professionals from all other analytical modalities; all that is needed is embedded in the general TOS framework. Still, this review concludes by answering a set of typical concerns from NIR practitioners.
机译:用于近红外分析的材料、批次和工艺的非代表性抽样通常充满了对完整测量不确定度MUtotal = TSE + TAE(NIR)的隐藏贡献。总采样误差 (TSE) 可能比总分析误差 TAE (NIR) 高出 5-10-25 倍,具体取决于材料异质性程度和用于生产微小等分试样的特定采样程序,这是唯一实际分析的材料。第 1 部分简要介绍了“批次到等分试样”途径中的所有抽样不确定性因素,这些因素必须被识别和正确管理(最大限度地消除或减少),尤其是抽样偏差,作为实现完全代表性抽样的先决条件。其中的关键是抽样理论(TOS),它以新颖紧凑的方式分为两部分。第 2 部分介绍了 (i) TOS 在过程取样中的应用,具体解决并说明了它在 PAT(过程分析技术)领域中的表现,以及 (ii) 一种称为复制实验 (RE) 的经验保障设施,用于估计与 NIR 分析相关的有效取样加分析不确定度水平 (MUtotal)。RE 是对损害分析责任的辩护。由于缺乏认识或培训,或故意忽视对TSE最小化需求的无知,都违反了有关分析QC/QA的尽职调查。第 2 部分最后特别关注:“所有这些 TOS 对 NIR 分析具体意味着什么?这个问题的答案可能会让许多人感到惊讶。与所有其他分析模式的专业人士相比,NIR分析师没有什么特别需要担心的;所有需要的都嵌入在通用的 TOS 框架中。尽管如此,本综述最后还是回答了NIR从业者的一系列典型问题。

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