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Introduction of Yield Quadrant and Yield Capability Index for VLSI Manufacturing

机译:Introduction of Yield Quadrant and Yield Capability Index for VLSI Manufacturing

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摘要

Yield enhancements and quality improvements must be considered as factors of the utmost importance in VLSI (Very Large Scale Integration circuits) manufacturing in order to reduce cost and ensure customer satisfaction. This paper will present a study of the yield theory, an analysis of actual manufacturing data, and the challenges of yield enhancement.
机译:为了降低成本并确保客户满意度,必须将提高良率和质量提高视为VLSI(超大规模集成电路)制造中最重要的因素。本文将对良率理论进行研究,分析实际制造数据,并提出良率提高的挑战。

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