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首页> 外文期刊>IEEE journal of selected topics in quantum electronics: A publication of the IEEE Lasers and Electro-optics Society >Operational Analysis of a Quantum Dot Optically Gated Field-Effect Transistor as a Single-Photon Detector
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Operational Analysis of a Quantum Dot Optically Gated Field-Effect Transistor as a Single-Photon Detector

机译:量子点光学门控场效应晶体管作为单光子探测器的运行分析

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We report on the operation of a novel single-photon detector, where a layer of self-assembled quantum dots (QDs) is used as an optically addressable floating gate in a GaAs/Al$_{0.2}$ Ga$_{0.8}$As $delta$-doped field-effect transistor. Photogenerated holes charge the QDs, and subsequently, change the amount of current flowing through the channel by screening the internal gate field. The photoconductive gain associated with this process makes the structure extremely sensitive to light of the appropriate wavelength. We investigate the charge storage and resulting persistent photoconductivity by performing time-resolved measurements of the channel current and of the photoluminescence emitted from the QDs under laser illumination. In addition, we characterize the response of the detector, and investigate sources of photogenerated signals by using the Poisson statistics of laser light. The device exhibits time-gated, single-shot, single-photon sensitivity at a temperature of 4 K. It also exhibits a linear response, and detects photons absorbed in its dedicated absorption layer with an internal quantum efficiency (IQE) of up to (68 $pm$ 18). Given the noise of the detection system, the device is shown to operate with an IQE of (53 $pm$ 11) and dark counts of 0.003 counts per shot for a particular discriminator level.
机译:我们报道了一种新型单光子探测器的运行情况,其中一层自组装量子点 (QD) 用作 GaAs/Al$_{0.2}$ Ga$_{0.8}$As $delta$ 掺杂场效应晶体管中的光学可寻址浮栅。光生空穴为量子点充电,随后通过屏蔽内部栅极场来改变流过沟道的电流量。与该过程相关的光电导增益使结构对适当波长的光极为敏感。我们通过对激光照明下量子点发出的沟道电流和光致发光进行时间分辨测量来研究电荷存储和由此产生的持久光电导率。此外,我们表征了探测器的响应,并使用激光的泊松统计量研究了光生信号的来源。该器件在 4 K 的温度下表现出时间门控、单脉冲、单光子灵敏度。它还表现出线性响应,并检测其专用吸收层中吸收的光子,其内部量子效率 (IQE) 高达 (68 $pm$ 18)%。考虑到检测系统的噪声,该器件在特定鉴别器级别下以 (53 $pm$ 11)% 的 IQE 和 0.003 次的暗计数运行。

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