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Direct and converse piezoelectric responses at the nanoscale from epitaxial BiFeO3 thin films grown by polymer assisted deposition

机译:直接和逆压电响应从外延BiFeO3纳米薄膜通过聚合物辅助沉积

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摘要

We use an original water-based chemical method to grow pure epitaxial BiFeO3 (BFO) ultra-thin films with excellent piezoelectric properties. Particularly, we show that this novel chemical route produces higher natural ferroelectric domain size distribution and coercive field compared to similar BFO films grown by physical methods. Moreover, we measured the d(33) piezoelectric coefficient of 60 nm thick BFO films by a direct approach, using Direct Piezoelectric Force Microscopy (DPFM). As a result, first piezo-generated charge maps of a very thin BFO layer were obtained applying this novel technology. We also performed a comparative study of the d(33) coefficients between standard PFM analysis and DPFM microscopy showing similar values i.e. 17 pm V-1 and 22 pC N-1, respectively. Finally, we proved that the directionality of the piezoelectric effect in BFO ferroelectric thin films is preserved at low thickness dimensions demonstrating the potential of chemical processes for the development of low cost functional ferroelectric and piezoelectric devices.
机译:我们使用一个原始水性化学方法纯粹的外延生长BiFeO3(拍频振荡器)超薄薄膜具有优良的压电性能。特别是,我们表明,该小说化学路线产生更高的自然铁电域大小分布和强制性字段类似的拍频振荡器相比电影增加了身体方法。压电系数60 nm厚的拍频振荡器电影由一个直接的方法,使用直接压电式力显微镜(DPFM)。结果,第一个piezo-generated电荷的地图很薄的拍频振荡器层得到应用新技术。研究d(33)系数之间的标准烤瓷分析和DPFM显微镜显示相似值即17点与它们22 pC n - 1,分别。方向性的拍频振荡器的压电效应铁电薄膜是保存在低厚度尺寸展示了潜力低化学过程的发展功能性铁电和压电成本设备。

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