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首页> 外文期刊>Applied Spectroscopy: Society for Applied Spectroscopy >Monitoring of the Thickness of Ultraviolet-Cured Pigmented Coatings and Printed Layers by Near-Infrared Spectroscopy
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Monitoring of the Thickness of Ultraviolet-Cured Pigmented Coatings and Printed Layers by Near-Infrared Spectroscopy

机译:通过近红外光谱监测紫外线固化的颜料涂层和印刷层的厚度

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摘要

Near-infrared (NIR) reflection spectroscopy was used for the determination of the thickness or the coating weight, respectively, of white-pigmented acrylic coatings and layers of printing inks. The thickness of coatings was studied in the range from 5 to 60 (mu)m, whereas the coating weights of the printed layers covered a range between 1 to 5 g m~(-2). Quantitative analysis of the spectral data relied on partial least squares (PLS) regression. A thickness gauge or gravimetry, respectively, were used to obtain reference data. Calibration models were typically based on six factors. The corresponding root mean square errors of prediction (RMSEP) were found to be on the order of 0.87 for coatings and 0.38 for printed layers. Monitoring of the coating thickness under process conditions was carried out on a pilot-scale roll coating machine. In order to simulate thickness changes during a coating process, either the nip between the applicator rolls or the web speed was varied. Data with high precision (standard deviation approx1 (mu)m for coatings, approx0.4 g m~(-2) for printed layers) and an excellent correlation with off-line reference data were obtained. The investigations have shown that NIR spectroscopy can be used for process control in coating and curing technology.
机译:使用近红外(NIR)反射光谱法分别测定了白色颜料丙烯酸涂料和印刷油墨层的厚度或涂料重量。研究了涂层的厚度在5至60μm的范围内,而印刷层的涂层重量覆盖了在1至5g m·(-2)之间的范围。光谱数据的定量分析依赖于偏最小二乘(PLS)回归。分别使用厚度计或重量分析仪获得参考数据。校准模型通常基于六个因素。发现相应的预测均方根误差(RMSEP)对于涂层约为0.87,对于印刷层约为0.38。在中试规模的辊涂机上对工艺条件下的涂层厚度进行监控。为了模拟涂布过程中的厚度变化,可以改变涂布辊之间的辊隙或幅材速度。获得了高精度的数据(涂层的标准偏差约为1μm,印刷层的标准偏差约为0.4 g m〜(-2)),并且与离线参考数据具有极好的相关性。研究表明,近红外光谱可用于涂层和固化技术的过程控制。

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