Persistent Spectral Hole Burning of Rare-Earth Ions-Doped Glasses

摘要

Persistent spectral hole burning (PSHB) of Sm{sup}2+ and Eu{sup}3+ ions-doped glasses were investigated. Al{sub}2O{sub}3-SiO{sub}2 glasses were prepared to dope the Sm{sub}3+ and Eu{sub}3+ ions using a sol-gel method, followed by heating in hydrogen atmosphere or irradiating with x-ray and laser. The persistent spectral hole burning (PSHB) was measured within the 7{sup left}Fo-5{sup left}Do transition. For the glasses containing OH bonds, the hole is formed by the photoinduced rearrangement of the OH bonds surrounding the rare-earth ions, and is thermally refilled and erased above ～200K. On the other hand, the glasses which were obtained by heating in hydrogen gas or irradiating with x-ray exhibited the hole spectra up to room temperature. The hole depth was independent of the temperature. The proposed mechanism is the electron transfer between the rare-earth ions and the defect centers related with Al{sup}(3+) ions in glass network.