State-of-The-Art System for Single Molecule Force Measurements to Nanoindentation Experiments

摘要

JPK Instruments continues to expand its family of high performance research systems with the announcement of the availability of the NanoWizard~R 3 NanoScience AFM system. Building relationships with the SPM community and collaborating with users worldwide has enabled JPK to develop powerful and flexible systems. Designing with upgradeability in mind guarantees a safe investment for users and an international team of experienced scientists and developers takes care of their service and support. The resulting NanoWizard~R 3 NanoScience system design provides the highest AFM performance in liquids and air, integrated with optical microscopy. It provides optimum imaging in air and liquid for single molecules, polymers and nanomaterials. The tip-scanning head equipped with a flexure scanner gives highest flexibility for a large variety of different samples. In particular, large sample size scanning is possible. The expanded flexibility and modularity of design coupled with the widest range of operation modes and accessories from electrochemistry to the tip-assisted optics module makes this the ideal platform for multiple users and applications.