RISE Microscopy for Correlative Raman-SEM Imaging Launched at Analytica 2014

摘要

Tescan Orsay Holdings and WITec GmbH jointly launched RISE Microscopy at Analytica 2014. RISE Microscopy is a novel correlative microscopy technique which combines confocal Raman Imaging and Scanning Electron (RISE) Microscopy within one integrated microscope system. This unique combination provides clear advantages for the microscope user with regard to comprehensive sample characterisation. The RISE Microscope enables for the first time the acquisition of SEM and Raman images from the same sample area and the correlation of ultra-structural and chemical information with one microscope system.