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首页> 外文期刊>IEEJ Transactions on Electrical and Electronic Engineering >Solving university course timetabling problem using localized island model genetic algorithm with dual dynamic migration policy
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Solving university course timetabling problem using localized island model genetic algorithm with dual dynamic migration policy

机译:使用局部岛屿模型遗传算法解决大学课程的时间表问题,并具有双动态迁移政策

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摘要

The University Course Timetabling Problem (UCTP) is a scheduling problem of assigning a teaching event in a certain time and room by considering the constraints of university stakeholders such as students, lecturers, and departments. This problem becomes complicated for universities with a large number of students and lecturers. Moreover, several universities are implementing student sectioning, which is a problem of assigning students to classes of a subject while respecting individual student requests, along with additional constraints. Such implementation also implies the complexity of constraints, which is larger accordingly. However, current and generic solvers have failed to meet the scalability and reliability requirements for student sectioning UCTP. In this paper, we introduce the localized island model genetic algorithm with dual dynamic migration policy (DM‐LIMGA) to solve student sectioning UCTP. Our research shows that DM‐LIMGA can produce a feasible timetable for the student sectioning problem and get better results than previous works and the current UCTP solver. Our proposed solution also consistently yield lower violation number than other algorithms, as evidenced by UCTP benchmark experiment results. © 2019 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.
机译:大学课程时间表问题(UCTP)是一个安排问题,即通过考虑大学利益相关者的限制(例如学生,讲师和部门。对于拥有大量学生和讲师的大学来说,这个问题变得复杂。此外,几所大学正在实施学生分区,这是将学生分配给学科课程的问题,同时尊重学生的要求以及其他限制。这种实现也意味着约束的复杂性,因此相应地较大。但是,当前和通用求解器未能满足学生分区UCTP的可扩展性和可靠性要求。在本文中,我们介绍了具有双动态迁移政策(DM -Limga)的本地化岛模型遗传算法,以解决UCTP的学生分区。我们的研究表明,与以前的工作和当前的UCTP求解器相比,DM -Limga可以为学生分区问题提供可行的时间表,并获得更好的结果。与其他算法相比,我们提出的解决方案还始终产生的违规数量较低,如UCTP基准实验结果所证明的那样。 ©2019日本电气工程师研究所。由John Wiley&amp出版Sons,Inc。

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