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首页> 外文期刊>IEEJ Transactions on Electrical and Electronic Engineering >Recognition method of voltage sag causes based on Bi‐LSTM
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Recognition method of voltage sag causes based on Bi‐LSTM

机译:基于BI -LSTM的电压下垂识别方法

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摘要

In recent years, the power quality problem has become more complicated in power grids because of the extensive usage of power electronics and multisource multitransformation features. The method, based on physical characteristics such as time domain, frequency domain and transform domain, is facing challenges in terms of adaptability, algorithm efficiency and accuracy for the recognition of complex disturbance recognition. The bidirectional long short‐term memory network is an algorithm in deep learning. It is based on data for characterization learning, which can effectively overcome the problem of information loss and generalization ability of physical methods. Moreover, it has the characteristics of memory, which can simultaneously consider historical information and future information and can better learn data features with time series characteristics. Aiming at the transient voltage sag time series data, this paper proposes a recognition method of the voltage sag causes based on the bidirectional long short‐term memory network's extraction eigenvalue, the full‐connection layer's high‐dimensional feature extraction and the Softmax network layer's classification. The experiment uses simulation data and measured data to prove that the model has good recognition ability and good antinoise performance in the recognition of voltage sag causes and can be reliably applied in practical engineering. © 2019 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.
机译:近年来,由于电源电子和多元化多元转换功能的广泛使用,功率质量问题在电网上变得更加复杂。该方法基于时间域,频域和变换域等物理特征,在适应性,算法效率和准确性方面面临着挑战,以识别复杂的干扰识别。双向长期记忆网络是深度学习中的算法。它基于用于表征学习的数据,该数据可以有效地克服信息丢失和物理方法的概括能力的问题。此外,它具有内存的特征,可以同时考虑历史信息和未来信息,并可以更好地学习具有时间序列特征的数据功能。针对瞬态电压SAG时间序列数据,本文提出了一种基于双向长期短期内存网络的提取特征值的识别方法的识别方法。 。该实验使用仿真数据和测量数据来证明该模型在识别电压下垂原因方面具有良好的识别能力和良好的抗抗性性能,并且可以可靠地应用于实践工程。 ©2019日本电气工程师研究所。由John Wiley&amp出版Sons,Inc。

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