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首页> 外文期刊>Journal of Nanoelectronics and Optoelectronics >Effect of Dibenzyl Disulfide Corrosion on Accelerated Thermal Aging Crosslinked Polyethylene Cable Materials with Copper Core and Insulation Layer
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Effect of Dibenzyl Disulfide Corrosion on Accelerated Thermal Aging Crosslinked Polyethylene Cable Materials with Copper Core and Insulation Layer

机译:二苄基二硫化物腐蚀对铜芯和绝缘层加速热老化交联聚乙烯电缆材料的影响

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Crosslinked polyethylene (XLPE) cable has been widely used and studied with its specific failure mechanism. Among them, although thermal aging of XLPE insulation materials has been widely studied, the effect of accelerated thermal aging on the sulfur corrosion of XLPE cable has not been studied much. For further understand the mechanism of sulfur corrosion, the accelerated thermal aging method was taken with 200 mg/kg DBDS based on the distinguish of temperature. The macro and micro analysis contrast test before and after corrosion were also taken to investigate the morphology difference, the element distribution, the influence of thermal aging and DBDS addition the corrosion of copper core, and the assessment of insulation layer was also carried out by Fourier transform infrared spectra and spectroscopy, scanning electron microscopy to distinguish the microstructure and composition. Under the accelerated thermal aging experiment with DBDS, both copper core and insulation layer of sample No. 1 exhibit the most serious corrosion and IP 111.93.14.78 On: Wed, 27 Jan 202 11:34 41 Copy ight Am rican Scientific P b h r aging condition. On the surface of the copper core, the DBDS-Cu complexes decompose to produce Cu2S Delivered by Ingenta and the temperature has a direct effect on this reaction. The insulation layer of sample No. 1 showed the most severe aging situation, with characteristic peaks of carbonyl appearing at 1720 cm-1 in the Fourier transform infrared tests and more defects, holes and cracks found in spectroscopy, scanning electron microscopy images.
机译:交联聚乙烯(XLPE)电缆以其特有的失效机理得到了广泛的应用和研究。其中,虽然XLPE绝缘材料的热老化已经得到了广泛的研究,但加速热老化对XLPE电缆硫腐蚀的影响还没有得到太多的研究。为了进一步了解硫腐蚀的机理,在区分温度的基础上,采用了200mg/kg DBDS的加速热老化方法。腐蚀前后还进行了宏观和微观分析对比试验,以研究铜芯的形态差异、元素分布、热老化和添加DBDS对铜芯腐蚀的影响,并通过傅里叶变换红外光谱和光谱仪对绝缘层进行了评估,扫描电子显微镜以区分微观结构和成分。在使用DBDS进行的加速热老化试验中,1号样品的铜芯和绝缘层均表现出最严重的腐蚀,IP 111.93.14.78,日期:Wed,20211年1月27日11:34 41,美国科学研究院P b h r老化条件。在铜芯表面,DBDS铜络合物分解生成Ingenta输送的Cu2S,温度对该反应有直接影响。1号样品的绝缘层显示出最严重的老化情况,在傅里叶变换红外测试中,羰基的特征峰出现在1720 cm-1处,光谱、扫描电子显微镜图像中发现更多缺陷、孔洞和裂纹。

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