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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Effect of local strain energy to predict accurate phase diagram of III-V pseudobinary systems: case of Ga(As,Sb) and (In,Ga)As
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Effect of local strain energy to predict accurate phase diagram of III-V pseudobinary systems: case of Ga(As,Sb) and (In,Ga)As

机译:局部应变能量来预测III-V伪系数的准确相图的影响:GA(AS,SB)和(IN,GA)的情况

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摘要

This work proposes an efficient and accurate methodology of ab initio thermodynamics to predict phase diagrams of III-V pseudobinary systems. The innumerable configurations of solid solutions are efficiently considered while maintaining accuracy by calculating the energies of freely relaxed configurations with the combined methodology using density functional theory calculations and cluster expansion. Then, the thermodynamic properties are calculated following a grand canonical ensemble framework that takes into account the local compositional fluctuation. The local strain energy induced by this local compositional fluctuation is found to be independent of the configuration; hence, it is calculated separately and added to the energy of a freely relaxed configuration, which significantly reduces the computational cost. This novel methodology is applied to calculate the phase diagrams of Ga(As,Sb) and (In,Ga)As, showing a good agreement with previous experimental reports. Notably, the strain energy is indispensable to predict phase diagrams accurately. It implies both the validity and the applicability of this method to other III-V pseudobinary systems. From an understanding of the crucial role of the strain energy in phase separation, an intuitive prediction is suggested through a simple estimation of the strain energy using the ratio of lattice parameters between various III-V semiconductor materials.
机译:这项工作提出了一种有效且准确的从头算热力学方法来预测III-V伪二元体系的相图。通过使用密度泛函理论计算和团簇展开相结合的方法计算自由松弛构型的能量,在保持精度的同时有效地考虑了固溶体的无数构型。然后,根据考虑局部成分涨落的大正则系综框架计算热力学性质。发现这种局部成分涨落引起的局部应变能与构型无关;因此,它被单独计算并添加到自由松弛构型的能量中,这显著降低了计算成本。将这种新方法应用于Ga(As,Sb)和(In,Ga)As的相图计算,与以往的实验结果吻合良好。值得注意的是,应变能对于准确预测相图是必不可少的。这意味着该方法对其他III-V伪二元系统的有效性和适用性。从对应变能在相分离中的关键作用的理解出发,通过使用各种III-V半导体材料之间晶格参数的比率对应变能进行简单估计,提出了一种直观的预测。

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