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Monte Carlo ray-trace diffraction based on the Huygens-Fresnel principle

机译:基于Huygens-Fresnel原理的蒙特卡罗射线散射衍射

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摘要

The goal of this effort is to establish the conditions and limits under which the Huygens-Fresnel principle accurately describes diffraction in the Monte Carlo ray-trace (MCRT) environment. This goal is achieved by systematic intercomparison of dedicated experimental, theoretical, and numerical results. We evaluate the success of the Huygens-Fresnel principle by predicting and carefully measuring the diffraction fringes produced by both single slit and circular apertures. We then compare the results from the analytical and numerical approaches with each other and with dedicated experimental results. We conclude that use of the MCRT method to accurately describe diffraction requires that careful attention be paid to the interplay among the number of aperture points, the number of rays traced per aperture point, and the number of bins on the screen. This conclusion is supported by standard statistical analysis, including the adjusted coefficient of determination, R-adj(2), the rms deviation, and the reduced chi-square statistic, chi(2)(nu). (C) 2018 Optical Society of America
机译:这项努力的目标是建立惠尼斯 - 菲涅耳原理准确描述了蒙特卡罗雷痕(MCRT)环境中的衍射的条件和限制。这一目标是通过专门的实验,理论和数值结果的系统性相互作用来实现。通过预测和仔细测量单个狭缝和圆形孔产生的衍射条纹来评估Huygens-Fresnel原理的成功。然后,我们将结果与分析和数值方法相互比较,并具有专用的实验结果。我们得出结论,使用MCRT方法来准确地描述衍射需要仔细注意孔径点数,屏幕上追踪的光线数量的相互作用,以及屏幕上的箱数。该结论由标准统计分析支持,包括调整后的测定系数,R-ACD(2),RMS偏差和降低的Chi-Square统计,Chi(2)(Nu)。 (c)2018年光学学会

著录项

  • 来源
    《Applied optics》 |2018年第18期|共7页
  • 作者单位

    Virginia Tech Dept Mech Engn Blacksburg VA 24061 USA;

    Virginia Tech Dept Phys Blacksburg VA 24061 USA;

    Virginia Tech Dept Phys Blacksburg VA 24061 USA;

    Virginia Tech Dept Mech Engn Blacksburg VA 24061 USA;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 应用;
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