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Ronchi and Moire patterns for testing spherical and aspherical surfaces using deflectometry

机译:RONCHI和MOIER图案用于使用偏转测量测试球形和非球面表面

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摘要

The aim of this paper is to compare the Ronchi test and the Moire deflectometry applied to a new pattern. To do so, we used two Ronchi patterns (typical Ronchigrams) produced by two identical Ronchi rulings angularly displaced and placed close to the curvature radius of a mirror. The result obtained by superposing both Ronchigrams is our new pattern, a Moire pattern of the Ronchigram (Moire-Ronchigram). The Zernike aberration polynomial coefficients of the tridimensional wavefront for both mirrors are obtained as a result. We also compared the Zernike coefficients obtained for each of the mentioned techniques and we found that the results with less dispersion are those where Moire deflectometry was applied. Finally, as a confidence test for applying and testing the Moire-Ronchigram, we compare our results with Open Fringe, FringeXP, and APEX, using the root-mean-square and standard deviation values. (C) 2018 Optical Society of America
机译:本文的目的是将RONCHI测试和莫尔义偏移测量进行比较应用于新图案。 为此,我们使用了两个相同的ronchi折射率产生的两个ronchi图案(典型的ronchigrams)角度地置换并靠近镜子的曲率半径。 通过叠加ronchigrams获得的结果是我们的新图案,罗什考拉的莫尔模式(Moire-ronchigram)。 作为结果,获得了两个镜子的三维波前的Zernike像差多项式系数。 我们还比较了对每个提到的技术获得的Zernike系数,并且我们发现,具有较少分散的结果是施加莫尔偏转测量的结果。 最后,作为应用和测试Moire-Ronchigram的置信度测试,我们使用根均线和标准偏差值将结果与开放式边缘,FRINGEPP和APEX进行比较。 (c)2018年光学学会

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  • 来源
    《Applied optics》 |2018年第34期|共9页
  • 作者单位

    Inst Nacl Astrofis Opt &

    Electr Dept Opt Luis Enrrique Erro 1 Puebla 72840 Mexico;

    Inst Nacl Astrofis Opt &

    Electr Dept Opt Luis Enrrique Erro 1 Puebla 72840 Mexico;

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  • 正文语种 eng
  • 中图分类 应用;
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