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首页> 外文期刊>Applied optics >Area-coding method in frequency comb profilometry fused with optical interferometry for measuring centimeter-depth objects with nanometer accuracy
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Area-coding method in frequency comb profilometry fused with optical interferometry for measuring centimeter-depth objects with nanometer accuracy

机译:频梳轮廓测定方法与光学干涉法融合,用于测量纳米精度的厘米深度对象

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Area coding masks in a frequency comb profilometer (FCP) based on a single-pixel imaging architecture are introduced for measuring a practical metal object that has weaker reflection than a specular object does. In such a case, it is important to increase the intensity of the encoded object light on the photodetector area because a photodiode operated at a high frequency of more than 1 GHz is generally small. The area-coding masks can concentrate more light on the focal point compared with random-coding masks that are commonly used. The increased intensity also increases the number of pixels in the FCP, and consequently accurate matching is achieved between the data obtained by optical interferometry and the FCP data. It was demonstrated that the introduction of area-coding masks increased the detected light intensity and allowed us to measure a practical metal object with 16 times more sampling points. (C) 2020 Optical Society of America
机译:引入基于单像素成像架构的频率梳状型仪(FCP)中的区域编码掩模,用于测量具有比镜面对象更弱的实际金属物体。 在这种情况下,重要的是增加光电探测器区域上的编码物体光的强度,因为在高于1GHz的高频处操作的光电二极管通常是小的。 与常用的随机编码掩模相比,区域编码掩模可以集中在焦点上的灯光。 增加的强度也增加了FCP中的像素数,因此在通过光学干涉测量和FCP数据获得的数据之间实现了精确匹配。 有人证明了面积编码掩模的引入增加了检测到的光强度,并使我们能够测量具有更多更多采样点的工具的实用金属物体。 (c)2020美国光学学会

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    《Applied optics》 |2020年第12期|共6页
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