Model-free determination of the birefringence and dichroism in c-cut crystals from transmission ellipsometry measurements

摘要

In this work, we derive closed-form expressions for determination of the linear birefringence and linear dichroism of uniaxial crystals utilizing transmission ellipsometry measurements at small angles of incidence in c-cut crystal substrates. The model-free method we use is an algebraic generalization of the method reported in Appl. Opt. 44, 3153 (2005). The optical anisotropy of substrates of sapphire, 4H-SiC, and 6H-SiC single crystals is measured for illustration. (C) 2020 Optical Society of America