Computer-Aided Control of the X-Ray Experiments on Domestic Diffractometers

摘要

An experience of automatization of domestic commercial diffractometers DRON, TRS, and TRS-K using personal computer IBM PC is analyzed. Modernization of the aforementioned diffractometers makes it possible to improve their service characteristics and extend the field of their application. The special feature of the system is the possibility of the goniometer axis control without using special angle detectors. The system developed may be used in determination of the lattice parameters in small single crystals including the samples exposed to external effects, as well as in determination of crystal orientation, texture, etc.