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X-ray diffraction and thermal expansion of intermediate valence compound Sm_(0.9)La_(0.1)S at high pressure

机译:高压下中间价化合物SM_(0.1)S的中间价化合物SM_(0.1)的X射线衍射和热膨胀

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摘要

SmS is well known to show a metal-insulator transition at high pressure around 0.7GPa at room temperature. By doping La for Sm, it shows metallic conductivity at ambient pressure with intermediate valence state by the effect of chemical pressure. But a phase transition from metallic to semiconducting state is observed at low temperature by applying pressure around O.6GPa. In the present work we attempted to measure lattice spacings and the thermal expansion of Sm_(0.9)La_(0.1)S under high pressure in order to clarify the relation between the metal-insulator transition and the lattice property.
机译:众所周知,SMS在室温下以约0.7gPa的高压显示金属绝缘体过渡。 通过掺杂La进行SM,它显示了环境压力下的金属导电,通过化学压力的影响,具有中间价态。 但是通过在O.6GPa周围施加压力,在低温下观察到从金属到半导体状态的相位转变。 在本工作中,我们试图在高压下测量晶格间距和SM_(0.9)LA_(0.1)S的热膨胀,以澄清金属绝缘体转变与晶格性能之间的关系。

著录项

  • 来源
    《希土類》 |2000年第36期|共2页
  • 作者

    Oomi G.; Kuwahara R.;

  • 作者单位

    Dept.of Chemcial Engineering University of Notre Dame Nore Dame IN 46556;

    Dept.of Chemcial Engineering University of Notre Dame Nore Dame IN 46556;

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  • 原文格式 PDF
  • 正文语种 jpn
  • 中图分类 冶金工业;
  • 关键词

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