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首页> 外文期刊>Advanced materials interfaces >Liquid–Liquid Interfacial Imaging Using Atomic Force Microscopy
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Liquid–Liquid Interfacial Imaging Using Atomic Force Microscopy

机译:使用原子力显微镜的液体液体界面成像

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> Nanoscale imaging of a liquid/liquid interface by atomic force microscopy (AFM) is achieved through the self‐assembly of interfacial layers of either polymers, lipids, or nanoparticles. Stabilization of the interface through spreading of a thin film of polystyrene‐b‐poly(methyl‐methacrylate) block copolymer or 1,2‐dioleoyl‐sn‐glycero‐3‐phosphoethanolamine lipids or adsorption of monolayers of silica nanoparticles allows reproducible imaging of these soft materials at an oil/water interface with nanoscale resolution on a timescale of 10 s. Amplitude modulation AFM is employed and requires that the subphase of water is below a critical depth of 100 μm to prevent excitation of gravity waves at the interface. The amplitude of these vertical oscillations is of the order of 1 nm but increases with the water layer depth. Below this critical water layer depth, force measurements show a linear compliance of the water/heptane and water/octane interfaces to be close to 10 ?2 N m ?1 . This study discusses in detail the experimental setup, sample preparation procedures, and AFM parameters necessary to achieve nanoscale resolution at the extremely soft and dynamic liquid interface. This expands the application of AFM to structural and dynamic nanoscale measurements for soft matter, biological, and nanomaterials away from solid supports.
机译: > 通过原子力显微镜(AFM)的液体/液体界面的纳米级成像通过聚合物,脂质或纳米颗粒的界面层的自组装来实现。通过扩散聚苯乙烯-B-聚(甲基 - 甲基丙烯酸甲酯)嵌段共聚物或1,2-Dioleyl-Sn-甘油-3-磷乙醇胺脂质或二氧化硅纳米粒子的吸附来稳定界面允许可重复的成像油/水界面的软材料,纳米级分辨率为10秒。采用幅度调制AFM,并且要求水的亚相低于100μm的临界深度,以防止在界面处激发重力波。这些垂直振荡的幅度为1nm的量级,但随着水层深度增加。低于该关键水层深度,力测量显示水/庚烷和水/辛烷接口的线性顺应性接近10 ?2 N M. ?1 。本研究详细讨论了在极柔软和动态液体界面处实现纳米级分辨率所需的实验设置,样品制备程序和AFM参数。这扩大了AFM在远离固体支撑件的软质,生物和纳米材料的结构和动态纳米级测量的应用。

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