Surface Chemical Analysis of DNA Microarrays: Application of XPS and ToF-SIMS for Surface Chemical Imaging on the urn Scale

摘要

The chemical composition of the functional surfaces of substrates used for microarrays is one of the important parameters that determine the quality of a microarray experiment. In addition to the commonly used contact angle measurements to characterise the wettability of functionalised supports, XPS and ToF-SIMS are more specific methods to elucidate details about the chemical surface constitution. Their application on printed DNA microarrays provides impressive chemical images down to the μm scale and can be utilised for label-free spot detection and characterisation.