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Energy confinement and thermal boundary conductance effects on short-pulsed thermal ablation thresholds in thin films

机译:能量限制与热边电导对薄膜短脉冲热消融阈值的影响

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For this paper, single-pulse ablationmechanisms of ultrafast laser pulses (25 ps) were studied for thin gold films (65 nm) on an array of substrates with varying physical properties. Using time-domain thermoreflectance, the interfacial properties of the thin-film systems are measured: in particular, the thermal boundary conductance. We find that an often used, and widely accepted relation describing threshold fluences of homogeneous bulk targets breaks down at the nanoscale. Rather than relying solely on the properties of the ablated Au film, the ablation threshold of these Au/substrate systems is found to be dependent on the measured thermal boundary conductance; we additionally find no discernible trend between the damage threshold and properties of the underlying substrate. These results are discussed in terms of diffusive thermal transport and the interfacial bond strength.
机译:为此,研究了超快激光脉冲(25ps)的单脉冲消融机制在具有不同物理性质的基材阵列上进行薄金膜(65nm)。 使用时域热反射,测量薄膜系统的界面性质:特别是热边界电导。 我们发现一个经常使用的,并广泛接受的描述均匀散装目标的阈值流量在纳米级下分解。 不是仅仅依赖于烧蚀的Au膜的性质,而是发现这些Au /衬底系统的消融阈值取决于测量的热边电导; 我们另外在底层基板的损伤阈值和属性之间没有发现没有可辨别的趋势。 这些结果在扩散热传输和界面键合强度方面讨论。

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