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Dual-trap technique for reduction of low-frequency noise in force measuring optical tweezers

机译:双阱技术可减少测力镊子中的低频噪声

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High-resolution long-time force measurements by optical tweezers are often limited by low-frequency (1/f) noise. A dual-trap technique is presented that can reduce such noise in the force signal. It incorporates a second trap (a reference trap) that probes the noise in the system and it is based upon the assumption that the low-frequency parts of the noise from the two traps are correlated. A subtraction of the low-frequency signal from the reference trap from the signal from the force measuring trap will therefore yield a net signal that is significantly less influenced by noise. It is shown that this dual-trap technique can reduce the noise in the force signal up to 60percent depending on detection bandwidth.
机译:光学镊子对高分辨率长时间力的测量通常受到低频(1 / f)噪声的限制。提出了一种双阱技术,可以减少力信号中的此类噪声。它包含一个第二个陷阱(参考陷阱),用于探测系统中的噪声,它基于以下假设:来自两个陷阱的噪声的低频部分是相关的。因此,将来自参考陷波器的低频信号与来自测力陷波器的信号相减将产生一个净信号,该净信号受噪声的影响要小得多。结果表明,根据检测带宽的不同,这种双阱技术可以将力信号中的噪声降低多达60%。

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